X-ray fluorescence holography (XFH) is a
holography method with atomic resolution based on atomic
fluorescence.[1] It is a relatively new technique that benefits greatly from the coherent high-power
X-rays available from
synchrotron sources, such as the
JapaneseSPring-8 facility.
Imaging
Fluorescent X-rays are scattered by
atoms in a sample and provide the object wave, which is referenced to non-scattered X-rays. A
holographic pattern is recorded by scanning a detector around the sample, which allows researchers to investigate the local 3D structure around a specific element in a sample.[2][3]
One of the criticisms for this method is that it suffers from twin images. D. Gabor. Barton proposed that reconstructed phased images of holograms will suppress twin images effects.[4]
^Hayashi, K. (2003). "3D atomic imaging of SiGe system by X-ray fluorescence holography". Journal of Materials Science: Materials in Electronics. 14 (5/7): 459–462.
doi:
10.1023/A:1023993911437.
ISSN0957-4522.
S2CID134765278.
^Chukhovskii, F. N.; Poliakov, A. M. (2003). "X-ray fluorescence holography: a novel treatment for crystal structure determination". Acta Crystallographica Section A. 59 (2): 109–116.
doi:
10.1107/S0108767302022274.
ISSN0108-7673.
PMID12604848.